DebyeScherrerSetups
Debye-Scherrer setups refer to a family of X-ray powder diffraction arrangements used for analyzing polycrystalline materials. Named after Peter Debye and Paul Scherrer, these configurations are widely employed for phase identification, lattice parameter determination, and crystallite-size studies in powders or small particles. The key feature is a random, isotropic sample orientation that produces diffraction cones around the incident beam.
In typical Debye-Scherrer geometry, a monochromatic X-ray beam irradiates a powdered sample contained in a thin-walled
Instrumentation and sample preparation emphasize simplicity and robustness. The capillary method requires finely ground powder sealed
Data interpretation relies on converting ring radii to 2θ angles, indexing reflections to identify phases, and