BraggSpitzen

BraggSpitzen is a term used in the field of crystallography to describe the points in reciprocal space where the intensity of X-ray or neutron diffraction is maximized. These points correspond to specific crystallographic planes within a crystal lattice. The term is derived from the names of the scientists who first described this phenomenon, William Lawrence Bragg and his son William Henry Bragg, who were awarded the Nobel Prize in Physics in 1915 for their work in determining crystal structures using X-ray diffraction.

The concept of BraggSpitzen is fundamental to the understanding of diffraction patterns obtained from crystalline materials. When a beam of X-rays or neutrons is incident on a crystal, the waves are scattered by the electrons in the crystal lattice. Constructive interference occurs when the path difference between the scattered waves is an integer multiple of the wavelength, leading to the formation of BraggSpitzen. The positions of these points in reciprocal space are determined by the lattice parameters of the crystal and the wavelength of the incident radiation.

BraggSpitzen are used to analyze the structure of crystals by providing information about the spacing and orientation of the crystallographic planes. The intensity of the diffraction peaks at these points is proportional to the square of the structure factor, which is a measure of the electron density distribution within the unit cell. By analyzing the positions and intensities of the BraggSpitzen, scientists can determine the atomic positions and the overall structure of the crystal.

In summary, BraggSpitzen are crucial for understanding the diffraction patterns of crystalline materials and for determining their atomic structures. The term encapsulates the key principles of X-ray and neutron diffraction, providing a foundation for the study of crystal structures in materials science and solid-state physics.