AFMkärjen

AFMkärjen is a Finnish term that translates to "AFM tip" or "AFM probe." It refers to the sharp, finely pointed element used at the end of an atomic force microscope (AFM) cantilever. This tip is the critical component that interacts with the sample surface, allowing the AFM to map its topography and other properties at the nanoscale.

The shape, material, and sharpness of the AFM tip are crucial for the quality of the AFM image. Tips are typically made from silicon or silicon nitride and can be conical, pyramidal, or spherical in shape. Their radius of curvature is often on the order of nanometers, enabling high-resolution imaging. Different tip types are used depending on the specific application, such as imaging soft biological samples or hard geological materials.

The tip is mounted on a flexible cantilever, which deflects as the tip encounters variations in the sample surface. This deflection is detected by a laser beam reflected off the back of the cantilever, providing a signal proportional to the surface height. As the cantilever scans across the sample, the detected deflections are used to construct a three-dimensional map of the surface.

AFMkärjen are consumables and can wear down or break during use, necessitating their replacement. The choice of AFM tip is a significant factor in achieving optimal imaging results and depends on the sample characteristics and the desired measurement.