tunneldusmikroskoopia
Tunneldusmikroskoopia, also known as scanning tunneling microscopy (STM), is a powerful tool used in nanotechnology and materials science to image surfaces at the atomic level. Developed by Gerd Binnig and Heinrich Rohrer in 1981, STM operates on the principle of quantum tunneling, where a sharp metal tip is brought very close to the sample surface, typically within a few angstroms. When a voltage is applied between the tip and the sample, electrons can tunnel through the vacuum barrier, creating a measurable current. By scanning the tip across the surface and monitoring the tunneling current, STM can generate high-resolution images of the sample's topography.
STM is particularly useful for studying conductive materials and can provide information about the electronic structure