röntgendiffrikció

Röntgenfdiffrikció, also known as X-ray diffraction (XRD), is a powerful analytical technique used to determine the atomic and molecular structure of a crystal. It relies on the principle that when X-rays interact with a crystalline material, they are diffracted in specific directions. This diffraction pattern is unique to the crystal structure of the material and can be analyzed to deduce information about the arrangement of atoms, lattice parameters, and even the presence of different phases.

The process typically involves directing a beam of X-rays onto a powdered or crystalline sample. As the X-rays strike the atoms in the crystal lattice, they are scattered in all directions. However, due to the ordered arrangement of atoms in a crystal, constructive interference occurs only at specific angles, leading to diffracted beams. A detector measures the intensity of these diffracted beams as a function of the diffraction angle. This data is then plotted as a diffractogram, showing peaks at angles corresponding to the crystal planes.

Röntgenfdiffrikció is widely applied in various scientific and industrial fields, including materials science, chemistry, geology, and pharmaceuticals. It is used for phase identification, determining crystallite size, measuring residual stress, and studying solid-state reactions. The technique is non-destructive, meaning the sample can be analyzed without being damaged. Its ability to provide detailed structural information makes it an indispensable tool for understanding and developing new materials.