difraktogramms

A difraktogramm, also known as a diffraction pattern, is a graphical representation of the intensity of scattered radiation as a function of diffraction angle. This pattern is produced when a beam of radiation, such as X-rays, neutrons, or electrons, interacts with a sample and undergoes diffraction. The phenomenon of diffraction occurs when waves encounter an obstacle or aperture with dimensions comparable to their wavelength, causing them to spread out. In materials science and crystallography, diffraction is a fundamental tool for determining the atomic or molecular structure of a substance.

The difraktogramm is generated by measuring the intensity of the diffracted radiation at various angles relative to the incident beam. The positions and intensities of the peaks in the difraktogramm are unique to the specific crystal structure and composition of the sample. Each crystalline material produces a characteristic diffraction pattern, much like a fingerprint. Analyzing these patterns allows researchers to identify crystalline phases, determine lattice parameters, assess crystallite size and strain, and even locate atoms within the crystal lattice. Different types of diffraction experiments, such as X-ray diffraction (XRD), neutron diffraction, and electron diffraction, utilize different radiation sources and can probe materials in distinct ways, yielding complementary information. The interpretation of difraktogramms requires specialized knowledge and computational tools.