caxis
Caxis, or the c-axis, is the crystallographic axis associated with the lattice parameter c in crystal systems that include a distinct axis perpendicular to a basal plane, most often the hexagonal and tetragonal systems. It defines a specific directional orientation within the crystal structure and is used to describe stacking and anisotropic properties.
In hexagonal crystals, the lattice is described by parameters a and c, with a = b and angles
The c-axis is important for understanding growth, texture, and anisotropy in materials. X-ray diffraction often analyzes
Measurement of the c-axis parameter is routine in crystallography and materials science, typically via X-ray or