XRDllä

XRDllä is a term used in crystallography and materials science to denote practices that revolve around X-ray diffraction. The term is not standardized and may refer to a range of related workflows rather than a single technique.

Origin and usage: The form with the diacritic suggests influence from Nordic languages, where -llä is a locative or instrumental suffix. In practice, XRDllä appears in informal or educational contexts to describe workflows that integrate X-ray diffraction data collection, processing, and interpretation.

Common components: Instrumentation includes an X-ray diffractometer and detectors, with sample preparation tailored to the material under study. Measurement modes may cover powder diffraction, single-crystal diffraction, and grazing-incidence diffraction. Data processing typically involves indexing, phase identification, and estimation of lattice parameters, followed by refinement using methods such as Rietveld or Pawley analyses. Interpretation emphasizes material structure, crystallinity, and phase composition, and may address defects, texture, and preferred orientation.

Relation to standards: XRDlla is not a formal standard; practitioners usually follow established X-ray diffraction protocols from international standards bodies and databases for accurate phase identification and quantitative analysis. When needed, XRDllä workflows may incorporate complementary techniques such as scanning electron microscopy, transmission electron microscopy, or Raman spectroscopy to resolve complex, multiphase systems.

See also: X-ray diffraction, Rietveld refinement, Grazing-incidence X-ray diffraction, Phase identification.