XPSmittaukset

XPSmittaukset, or X-ray Photoelectron Spectroscopy measurements, are a surface-sensitive quantitative spectroscopic technique. This technique is used to analyze the elemental composition and chemical state of a material's surface. XPS works by irradiating the sample with X-rays, which causes the emission of photoelectrons from the top few nanometers of the material. The kinetic energy of these emitted electrons is measured. Because the energy of the incoming X-rays is known, the binding energy of the electrons can be calculated. This binding energy is unique to each element and its chemical environment, allowing for identification of the elements present and their oxidation states.

The information obtained from XPS is primarily related to the outermost atomic layers of a solid sample. This makes it ideal for studying thin films, coatings, and surfaces exposed to various environments. XPS can provide quantitative elemental composition, determine the chemical state (oxidation state and bonding environment) of elements, and reveal information about the electronic structure of the material. It is a non-destructive technique, although sample preparation might be required for some analyses. Common applications include materials science, chemistry, physics, and engineering, for tasks such as quality control, failure analysis, and research into surface phenomena.