SINEd

SINEd is a software application developed by the National Institute of Standards and Technology (NIST) in the United States. It is designed to simulate the behavior of semiconductor devices, particularly metal-oxide-semiconductor field-effect transistors (MOSFETs). The software is widely used in the semiconductor industry for research, development, and education purposes.

SINEd stands for "Simulation of Integrated Electronics Devices." It is based on the drift-diffusion model, which describes the movement of charge carriers in semiconductor devices. The software can simulate a variety of device structures, including MOSFETs, bipolar junction transistors (BJTs), and heterojunction devices.

One of the key features of SINEd is its ability to handle complex device structures and geometries. It can simulate devices with multiple layers, different materials, and various doping profiles. The software also includes a graphical user interface (GUI) that allows users to easily define device structures and set simulation parameters.

SINEd is available for free download from the NIST website. It is distributed under the GNU General Public License (GPL), which allows users to modify and distribute the software. The software is supported by a user community and a team of developers at NIST.