Röntgenädeanalyysi

Röntgenädeanalyysi, also known as X-ray diffraction (XRD), is a powerful analytical technique used to determine the atomic and molecular structure of a crystal. It relies on the principle that when X-rays strike a crystal lattice, they are diffracted in specific directions according to Bragg's Law. The angles and intensities of these diffracted X-rays form a unique pattern, a diffraction pattern, which acts as a fingerprint for the crystalline material.

By analyzing this diffraction pattern, scientists can deduce the arrangement of atoms within the crystal, including the size and shape of the unit cell, the positions of atoms within the unit cell, and the overall crystal structure. This information is crucial for identifying unknown crystalline substances, characterizing the purity of crystalline materials, and studying phase transformations.

The process typically involves directing a beam of monochromatic X-rays at a powdered or solid crystalline sample. A detector then measures the intensity of the diffracted X-rays as a function of the diffraction angle. Sophisticated software is used to interpret the resulting diffraction pattern and compare it against databases of known crystal structures. Röntgenädeanalyysi finds widespread applications in fields such as materials science, chemistry, geology, and pharmaceuticals for research, quality control, and materials characterization.