Röntgendifraktsiossa

Röntgendifraktsiossa, often referred to as X-ray diffraction (XRD) in English, is a non-destructive analytical technique used for determining the atomic and molecular structure of a crystal. It relies on the phenomenon of diffraction, where X-rays are scattered by the electrons of atoms in a regular arrangement within a crystal lattice. When a beam of X-rays strikes a crystalline sample, the waves are diffracted in specific directions, creating a unique diffraction pattern. This pattern is a fingerprint of the crystal's structure, providing information about the spacing between atomic planes, crystal orientation, and the presence of different crystalline phases.

The process typically involves directing a monochromatic X-ray beam onto a powdered or single-crystal sample. The diffracted X-rays are then detected by a sensor, such as a scintillation counter or a charge-coupled device (CCD) detector, which records their intensity and angular position. The resulting data is plotted as a diffraction pattern, showing peaks at specific angles (2θ) corresponding to constructive interference of the diffracted X-rays. Analyzing the positions and intensities of these peaks allows researchers to deduce the unit cell dimensions, atomic positions, and other crystallographic parameters.

Röntgendifraktsiossa is widely applied in various fields, including materials science, chemistry, geology, and pharmaceuticals. It is used for identifying unknown crystalline substances, determining the purity of materials, characterizing thin films, studying phase transitions, and investigating the texture and strain within crystalline materials. The technique is invaluable for understanding the relationship between a material's structure and its properties.