Difraktogramm

A difraktogramm, also known as a diffraction pattern, is a graphical representation of the intensity of scattered radiation as a function of diffraction angle. This pattern is produced when a beam of radiation, such as X-rays, electrons, or neutrons, interacts with a sample and undergoes diffraction. The diffraction process occurs when the radiation waves are scattered by the periodic arrangement of atoms or molecules within the sample.

The positions and intensities of the peaks in a difraktogramm are characteristic of the specific crystal structure and composition of the material. By analyzing the difraktogramm, scientists can determine a wealth of information about the sample, including its crystalline phases, lattice parameters, crystallite size, and preferred orientation. This technique is widely used in fields such as materials science, chemistry, physics, and mineralogy for material characterization and identification.

For instance, in X-ray diffraction (XRD), a difraktogramm is generated by measuring the intensity of scattered X-rays at various angles. Each crystalline material produces a unique difraktogramm, acting as a fingerprint that can be used for identification. Similarly, electron diffraction and neutron diffraction produce characteristic patterns that provide complementary information about the sample's structure. The analysis of difraktogramms is a fundamental tool for understanding the atomic-level structure and properties of matter.