Diffraktometri

Diffraktometri is a scientific technique used to probe the atomic and molecular structure of a material. It relies on the principle of diffraction, where waves of radiation, such as X-rays, neutrons, or electrons, are scattered by the periodic arrangement of atoms or molecules within a sample. The scattered waves interfere constructively and destructively, producing a diffraction pattern that is characteristic of the material's structure.

The diffraction pattern, typically recorded on a detector, consists of spots or rings of varying intensity at specific angles. By analyzing the positions and intensities of these diffracted features, scientists can deduce information about the size, shape, orientation, and spacing of the constituent units in the material. This allows for the determination of crystal structures, phase identification, crystallite size, and strain.

Various types of diffraktometry exist, primarily distinguished by the type of radiation used. X-ray diffraktion (XRD) is the most common, utilizing X-rays that interact strongly with electron clouds of atoms. Neutron diffraktion is particularly useful for locating light atoms like hydrogen and for studying magnetic structures. Electron diffraktion is employed for analyzing very thin films and nanoscale materials.

Diffraktometri is a versatile tool with applications across numerous scientific and engineering disciplines, including materials science, chemistry, physics, geology, and biology. It is essential for quality control, research and development, and the characterization of crystalline solids, powders, thin films, and even biological macromolecules.