Diffraktiopeaks

Diffraktiopeaks are the intensity maxima observed in a diffracted wave field when electromagnetic, electron, or neutron waves scatter from a material with a periodic or quasi-periodic structure. They arise from constructive interference of waves scattered by regularly spaced features such as crystal planes, layers, or other periodic motifs.

Two main frameworks describe their positions: Bragg's law for reflection from crystal planes, nλ = 2d sin θ, where d is the interplanar spacing and θ is the scattering angle; and the reciprocal lattice picture, where each peak corresponds to a reciprocal lattice vector G with scattering condition k_s − k_i = G.

Peak positions determine lattice parameters and phase identity, while their intensities reflect the structure factor and sample composition. Peak widths provide information about crystallite size, microstrain, and instrumental resolution. In practice, diffraction data show a set of peaks at characteristic angles, whose pattern is used to identify materials and quantify phase fractions.

Techniques such as X-ray diffraction (XRD), electron diffraction, and neutron diffraction produce diffraktiopeaks in different regimes and with different contrast. Methods like Rietveld refinement fit entire diffraction patterns to crystallographic models in order to extract quantitative parameters.

Peak shapes are influenced by instrument broadening, sample morphology, crystallite size (Scherrer broadening), strain, and defects. Correct interpretation requires consideration of instrumental contributions and proper background subtraction.

Diffraktiopeaks underpin many applications in materials science, chemistry, and physics, including phase identification, lattice-parameter determination, thin-film analysis, and microstructural characterization. The term 'diffraktiopeaks' is sometimes used in non-English sources or as a pedagogical label for diffraction maxima; in standard crystallography the conventional term is 'diffraction peaks' or 'Bragg peaks.'