Diffraktiopeakkeja

Diffraktiopeakkeja, known in English as diffraction peaks, are a fundamental observation in the study of crystalline materials using diffraction techniques such as X-ray diffraction (XRD) or neutron diffraction. When a beam of radiation, like X-rays, interacts with a regular, repeating arrangement of atoms in a crystal lattice, the scattered waves interfere with each other. This interference can be constructive, leading to amplified scattering in specific directions, or destructive, canceling out the scattered waves.

Diffraction peaks arise from constructive interference. According to Bragg's law, constructive interference occurs when the path difference between waves scattered from adjacent atomic planes in the crystal is an integer multiple of the wavelength of the incident radiation. This path difference is directly related to the spacing between these atomic planes and the angle of incidence of the radiation. Consequently, diffraction peaks are observed at specific angles that are characteristic of the crystal structure and the spacing of its atomic planes.

The position and intensity of these diffraction peaks provide a wealth of information about the material. The angles at which the peaks appear are used to determine the unit cell dimensions and symmetry of the crystal. The intensities of the peaks are related to the types and arrangement of atoms within the unit cell. By analyzing the complete diffraction pattern, which is a plot of intensity versus diffraction angle, researchers can identify crystalline phases, determine crystal structures, assess crystallite size, and detect strain within the material. Therefore, the analysis of diffraction peaks is a cornerstone of solid-state physics, chemistry, and materials science.