sekundärjonmasspektrometri

Sekundärjonmas is a term that appears in limited linguistic or translation contexts to denote the mass or spectrum of secondary ions produced when a material surface is irradiated and analyzed by mass spectrometry. In mainstream scientific usage, the phenomenon is described more precisely as secondary ion mass spectrometry (SIMS) or, when referring specifically to the data, as the secondary ion spectrum. The coinage blends sekun­där (secondary), jon (ion), and mas(s) (mass), forming a compact form that is not consistently standardized across languages.

Definition and scope of the term are variable. Some sources use sekundärjonmas to refer to the collection of masses of secondary ions, while others interpret it as the resulting spectrum obtained from the mass analysis of those ions. Because the term is not widely standardized, its exact meaning can differ between authors or regions, and it is generally advisable to use established terms such as SIMS or secondary ion spectrum for clarity.

Mechanistically, the concept aligns with the well-known process in surface analysis: a primary beam (ions, electrons, or photons) bombard a sample, ejecting and often ionizing atoms from the surface. The emitted secondary ions are then directed into a mass analyzer, where their mass-to-charge ratios are measured to produce a spectrum that informs about composition and distribution at or near the surface.

Related terms include secondary ion mass spectrometry (SIMS), sputtering, ionization, and mass spectroscopy. Sekundärjonmas remains an uncommon or informal label, and readers are typically advised to rely on the standard terminology in peer-reviewed literature.