röntgenfluoresenssispektroskopian

Röntgenfluoresenssispektroskopia, often abbreviated as XRF, is an analytical technique used for determining the elemental composition of a sample. It works by irradiating a sample with X-rays, which causes atoms in the sample to emit characteristic fluorescent X-rays at specific energies. By measuring the energies and intensities of these emitted X-rays, one can identify and quantify the elements present in the sample.

The process begins with an X-ray source, typically a rhodium or tungsten tube, that generates a broad spectrum of X-rays. These primary X-rays strike the sample, exciting electrons in the atoms. When an excited electron drops back to a lower energy level, it emits a secondary X-ray, known as fluorescence. The energy of this fluorescent X-ray is unique to the element from which it originated, acting like a fingerprint.

A detector then measures the energy and number of these fluorescent X-rays. By comparing the measured energies to known spectral lines of elements, the presence of specific elements can be identified. The intensity of the fluorescence is proportional to the concentration of the element, allowing for quantitative analysis. XRF is a non-destructive technique, meaning the sample remains intact after the analysis, making it suitable for a wide range of applications. It is used in fields such as materials science, environmental monitoring, geology, and art conservation for its speed, sensitivity, and ability to analyze solids, liquids, and powders.