pulverdiffraktion

Pulverdiffraktion, also known as powder diffraction or X-ray powder diffraction (XRPD), is a common analytical technique used for the characterization of crystalline materials. It involves directing a beam of X-rays at a sample of powdered material and measuring the angles at which the X-rays are diffracted. Crystalline materials possess a regular, repeating arrangement of atoms. When X-rays strike these atoms, they are scattered in specific directions, creating a diffraction pattern. This pattern is unique to each crystalline substance, acting as a fingerprint for identification.

The diffracted X-rays are detected and recorded, typically as a plot of intensity versus diffraction angle (often denoted as 2θ). The positions of the diffraction peaks correspond to the spacing between atomic planes within the crystal lattice, as described by Bragg's Law. The intensities of these peaks are related to the arrangement and types of atoms within the unit cell. By analyzing this diffraction pattern, researchers can determine a wealth of information about the material.

Common applications of pulverdiffraktion include phase identification, where the unknown crystalline material is identified by comparing its diffraction pattern to a database of known patterns. It is also used to determine crystallographic structure, quantify the amount of different crystalline phases in a mixture, assess crystallite size, and measure lattice strain. The technique is non-destructive, meaning the sample can be analyzed without being damaged, making it valuable in various scientific and industrial fields such as materials science, chemistry, geology, and pharmaceuticals.