XRFanalüüs

XRFanalüüs, known more formally as X-ray fluorescence analysis, is a non-destructive analytical technique used for elemental analysis and chemical composition determination of a wide range of materials. The principle behind XRF involves exposing a sample to a beam of X-rays. This excitation causes the atoms within the sample to emit characteristic secondary X-rays, also known as fluorescence. Each element in the sample emits fluorescence X-rays at specific energies, creating a unique spectral fingerprint. By measuring the energies and intensities of these emitted X-rays, one can identify the elements present and quantify their concentrations.

The instrumentation for XRF typically includes an X-ray source, a sample holder, and a detector. The X-ray source, often a sealed X-ray tube, generates the primary X-ray beam. The sample is then placed in the path of this beam. The emitted fluorescence X-rays are collected by a detector, which measures their energy and intensity. Common detector types include proportional counters and semiconductor detectors. The data obtained from the detector is then processed by software to produce a spectrum that can be analyzed for elemental identification and quantification. XRF is a versatile technique applicable to solids, liquids, and powders, and requires minimal sample preparation. It is widely employed in various fields such as geology, mining, environmental monitoring, material science, and quality control in manufacturing industries due to its speed, sensitivity, and ability to analyze multiple elements simultaneously.