XRFanalüüs
XRFanalüüs, known more formally as X-ray fluorescence analysis, is a non-destructive analytical technique used for elemental analysis and chemical composition determination of a wide range of materials. The principle behind XRF involves exposing a sample to a beam of X-rays. This excitation causes the atoms within the sample to emit characteristic secondary X-rays, also known as fluorescence. Each element in the sample emits fluorescence X-rays at specific energies, creating a unique spectral fingerprint. By measuring the energies and intensities of these emitted X-rays, one can identify the elements present and quantify their concentrations.
The instrumentation for XRF typically includes an X-ray source, a sample holder, and a detector. The X-ray