Valgusvälkmikroskoobid
Valgusvälkmikroskoobid, also known as scanning electron microscopes (SEM), utilize a focused beam of electrons to scan the surface of a specimen. Unlike transmission electron microscopes which pass electrons through a thin sample, SEMs detect secondary and backscattered electrons that are emitted from the sample's surface when it is struck by the primary electron beam. These emitted electrons are then collected and processed to form an image that reveals the topography and composition of the specimen.
The resolution of SEMs is significantly higher than that of light microscopes, allowing for the visualization