Valgusvälkmikroskoobid

Valgusvälkmikroskoobid, also known as scanning electron microscopes (SEM), utilize a focused beam of electrons to scan the surface of a specimen. Unlike transmission electron microscopes which pass electrons through a thin sample, SEMs detect secondary and backscattered electrons that are emitted from the sample's surface when it is struck by the primary electron beam. These emitted electrons are then collected and processed to form an image that reveals the topography and composition of the specimen.

The resolution of SEMs is significantly higher than that of light microscopes, allowing for the visualization of extremely fine details, often down to the nanometer scale. This capability makes them invaluable tools in various scientific fields, including materials science, biology, geology, and forensics. By analyzing the emitted electrons, it's possible to determine the elemental composition of different areas on the sample surface. This dual capability of high-resolution imaging and elemental analysis makes SEMs a powerful analytical instrument for understanding the structure and properties of matter.