Röntgendiffraaktiota

Röntgendiffraaktiota, often abbreviated as XRD, is a powerful analytical technique used to determine the atomic and molecular structure of a crystalline material. It is based on the principle that when X-rays strike a crystal lattice, they are diffracted in specific directions according to Bragg's Law. This diffraction pattern is unique to each crystalline substance, acting like a fingerprint that can be used for identification and characterization.

The process involves directing a beam of monochromatic X-rays onto a powdered or single-crystal sample. The X-rays interact with the electron clouds of the atoms within the crystal structure, scattering in all directions. However, constructive interference occurs only at specific angles, leading to intense diffraction peaks. These peaks are recorded by a detector, forming a diffraction pattern.

Analysis of this pattern, particularly the angles and intensities of the diffraction peaks, allows researchers to deduce information about the arrangement of atoms in the crystal, including lattice parameters, crystal structure type, and the presence of different phases. XRD is widely used in materials science, chemistry, geology, and solid-state physics for phase identification, quantitative phase analysis, crystal structure determination, and strain analysis. It is a non-destructive technique, meaning the sample can often be analyzed without being damaged.