Röntgenpektroskopia

Röntgenpektroskopia, also known as X-ray spectroscopy, is a family of techniques used to study the elemental composition and chemical state of a sample. It involves the interaction of X-rays with matter. When X-rays strike a material, they can be absorbed, scattered, or induce the emission of secondary X-rays or electrons from the sample. The analysis of these emitted or transmitted X-rays provides unique information.

One common technique is X-ray fluorescence (XRF) spectroscopy. In XRF, incident X-rays excite atoms in the sample, causing them to emit characteristic X-rays at energies specific to each element. By measuring the energies and intensities of these emitted X-rays, one can identify and quantify the elements present in the sample. XRF is a non-destructive method widely used in materials science, geology, archaeology, and environmental monitoring.

Another important method is X-ray photoelectron spectroscopy (XPS), also known as electron spectroscopy for chemical analysis (ESCA). XPS uses X-rays to eject electrons from the surface of a material. The kinetic energy of these emitted electrons is measured, which is related to the binding energy of the electrons in their original atomic orbitals. Since binding energies are sensitive to the chemical environment of an atom, XPS can provide information about the elemental composition and chemical state, including oxidation states and bonding characteristics, of the outermost layers of a sample. This makes XPS invaluable for surface analysis in fields such as semiconductor manufacturing, catalysis, and materials engineering. Other Röntgenpektroskopia techniques include X-ray absorption spectroscopy (XAS) and X-ray diffraction (XRD), which probe different aspects of the material's electronic structure and atomic arrangement.