Mittauskohina

Mittauskohina refers to unwanted random fluctuations present in any measurement system. It is an inherent characteristic of electronic devices and physical processes that can obscure or distort the true signal being measured. This noise can originate from various sources, including thermal agitation of electrons within resistors (Johnson-Nyquist noise), shot noise due to the discrete nature of charge carriers, and external electromagnetic interference.

The presence of mittauskohina limits the precision and accuracy of measurements. In scientific experiments, engineering applications, and everyday devices like thermometers or microphones, the signal-to-noise ratio (SNR) is a crucial parameter. A higher SNR indicates that the desired signal is much stronger than the background noise, leading to more reliable results.

Strategies to mitigate mittauskohina include using more sensitive and well-shielded equipment, employing averaging techniques where multiple measurements are taken and their values combined to reduce random fluctuations, and implementing digital filtering algorithms to selectively remove or attenuate noise frequencies. Understanding the nature and sources of mittauskohina is essential for designing effective measurement strategies and interpreting data accurately.