Mikrobolometri

Mikrobolometer is a type of uncooled thermal infrared detector. It operates by measuring the change in electrical resistance of a sensing material when it absorbs infrared radiation. When infrared photons strike the microbolometer's absorber element, they cause a temperature increase. This temperature change alters the resistance of the sensing material, typically a semiconductor with a high temperature coefficient of resistance (TCR), such as amorphous silicon or vanadium oxide. This resistance change is then converted into an electrical signal, which can be processed to create an image.

Microbolometers are typically fabricated using microelectromechanical systems (MEMS) technology, allowing for miniaturization and mass production. They are arranged in a two-dimensional array, with each pixel acting as an individual detector. The absence of a cooling system, such as a Stirling cooler used in cryogenic detectors, makes microbolometers significantly smaller, lighter, and less power-hungry. This uncooled nature contributes to their widespread use in various applications.

The primary advantage of microbolometers is their affordability and portability compared to cooled infrared detectors. They are sensitive enough for many common imaging tasks, though their performance in terms of noise equivalent temperature difference (NETD) might be slightly lower than their cooled counterparts. Despite this, their practicality has led to their integration into a vast array of devices, including thermal imaging cameras for security, surveillance, industrial inspection, automotive night vision, and even consumer electronics. The ongoing development in materials and fabrication processes continues to improve their performance and expand their capabilities.