röntgenstralingsdiffractie

Röntgenstralingsdiffractie, often abbreviated as XRD, is an analytical technique used for determining the crystal structure of materials. It involves directing a beam of X-rays at a sample and measuring the angles at which the X-rays are scattered or diffracted by the atoms within the crystal lattice. The diffraction pattern produced is unique to each crystalline material and can be analyzed to identify the material and its structural properties.

The principle behind XRD relies on Bragg's Law, which describes the condition for constructive interference of X-rays diffracted by crystal planes. When X-rays strike a crystalline material, they are scattered by the electron clouds of the atoms. If the scattered waves are in phase, they interfere constructively, producing a diffracted beam at a specific angle. Bragg's Law states that nλ = 2d sin(θ), where n is an integer, λ is the wavelength of the X-rays, d is the spacing between crystal planes, and θ is the angle of incidence.

XRD is a non-destructive technique, meaning it does not alter the sample. It is widely used in various fields, including materials science, chemistry, geology, and pharmaceuticals, for material identification, phase analysis, crystallite size determination, and strain analysis. The intensity and position of the diffraction peaks in the resulting diffractogram provide information about the arrangement and spacing of atoms within the crystal structure.