röntgendiffraktometriin

Röntgendiffraktometriin, often abbreviated as XRD, is a powerful analytical technique used to determine the atomic and molecular structure of a crystalline material. It involves directing a beam of X-rays at a sample and observing how the X-rays are scattered or diffracted by the atoms within the crystal lattice. The diffraction pattern produced is unique to each crystalline substance, acting like a fingerprint that allows for identification and characterization.

The fundamental principle behind XRD is Bragg's Law, which describes the condition for constructive interference of X-rays diffracted by crystal planes. When X-rays strike a crystalline sample at a specific angle, they are scattered by the planes of atoms. If the scattered waves are in phase, they reinforce each other, leading to a strong diffracted beam. Bragg's Law states that 2d sin(θ) = nλ, where 'd' is the spacing between the crystal planes, 'θ' is the angle of incidence, 'n' is an integer, and 'λ' is the wavelength of the X-rays.

By measuring the angles at which diffraction occurs and the intensity of the diffracted beams, scientists can determine the arrangement of atoms, the size and shape of the unit cell, and the presence of different crystalline phases within a sample. XRD is widely used in various fields, including materials science, chemistry, physics, geology, and pharmaceuticals, for applications such as phase identification, quantitative phase analysis, crystallite size determination, and strain analysis.