Röntgenkidefraktion

Röntgenkidefraktion, often abbreviated as XRD, is an analytical technique used to determine the atomic and molecular structure of a crystal. It relies on the scattering of X-rays by the electrons in a crystalline material. When a beam of X-rays strikes a sample, the X-rays are diffracted in specific directions, creating a diffraction pattern. This pattern is unique to the crystal structure of the material.

The fundamental principle behind XRD is Bragg's Law, which describes the condition for constructive interference of X-rays diffracted by crystal planes. Bragg's Law states that 2d sin(θ) = nλ, where d is the spacing between crystal planes, θ is the angle of incidence of the X-ray beam, n is an integer, and λ is the wavelength of the X-rays. By measuring the angles at which diffraction peaks occur, and knowing the X-ray wavelength, the d-spacings within the crystal can be determined.

The resulting diffraction pattern, a plot of intensity versus diffraction angle, serves as a fingerprint for the material. This allows for the identification of crystalline phases present in a sample, quantification of the relative amounts of different phases, and determination of crystallite size, strain, and texture. XRD is a non-destructive technique widely used in fields such as materials science, chemistry, geology, and pharmaceuticals for material characterization and quality control.