exchangebias
Exchange bias is a phenomenon observed at the interface between a ferromagnet and an antiferromagnet. It manifests as a shift in the magnetic hysteresis loop of the ferromagnetic layer to higher or lower magnetic fields compared to the zero-field position. This shift is a result of the interfacial exchange interaction between the uncompensated magnetic moments of the antiferromagnet and the ferromagnet.
The effect was first reported by Meeks in 1956, though it was formally described and explained by
When the ferromagnet is cooled in the presence of a magnetic field through the Néel temperature of
Exchange bias is crucial in many spintronic devices, particularly magnetic random-access memory (MRAM) and read heads