2Dprofilometrie

2Dprofilometrie, or two-dimensional profilometry, is the measurement of a surface height along a single straight line, yielding a one-dimensional height profile z = f(x). It is the 2D counterpart to 3D profilometry, which maps topography over an area.

Measurement principles can be in contact or non-contact forms. In contact profilometry, a sharp stylus scans the surface with a constant feed rate and low normal force, converting vertical deflections into height data. In optical 2D profilometry, a line of light or a laser line intersects the surface and height variations are inferred from changes in focus, phase, or reflected intensity along the line. Optical methods may use confocal, interferometric, or structured-light approaches and can be combined with scanning or line-projection techniques.

The generated data are a height profile along the measurement line. This profile is analyzed to determine roughness and waviness along the line, described by parameters such as Ra, Rq, and Rz, and to assess form features like steps or grooves after appropriate filtering. Results are often compared to tolerances or design specifications and used for process control or feature verification.

Applications span quality control and research in manufacturing, automotive, electronics, and materials science. 2D profilometry is particularly useful for characterizing surface finishes, coating thickness variations along a line, step heights, and microstructure features where full 3D mapping is unnecessary or impractical.

Limitations include its one-dimensional nature, providing information only along the measured line. Resolution, tip geometry (for contact methods), surface reflectivity, tilt, and environmental stability influence accuracy. Proper calibration and traceability are essential for reliable metrological use.